LQ-BI0704 is a device specially developed for the aging test of COC devices. The main body of the equipment adopts a frame structure, and the carrier is designed as a detachable "drawer" type, with each drawer supporting independent temperature control. The carrier is equipped with a standard quick-connect electrical interface, allowing different carriers customized for various products to be tested on the same test platform.

Split-type

Independent Temperature Control

High-precision Temperature Control




LD Chip Type
Test Functions
Aging Test Time


Submount Size
Customized according to customer needs

Wavelength range
1000nm—1600nm



