LQ-BI114 is an equipment specially developed for aging test of COC devices.
The main body of the equipment adopts a frame structure, and the carrier adopts a separable “drawer” form, and each drawer can control the temperature independently.
The carrier adopts standard quick-plug electrical interface, which can be designed according to different products and different carriers can be tested in the same test platform.
Split-type
Independent Temperature Control
High-precision Temperature Control
LD Chip Type
Test Functions
Aging Test Time
Submount Size
Customized according to customer needs
Wavelength range
1000nm—1600nm
