Chip Aging Tester Common Failures and Quick Repair Methods

Chip aging tester is crucial in the process of guaranteeing the reliability of the chip, and once a failure occurs, it will affect the test progress and chip quality. The following is an introduction to common failures and quick repair methods.

Hardware failure

Power supply failure: manifested as the tester can not be turned on or turn on after frequent power outages. It may be the power module is damaged, the power cord is loose or the fuse is blown. Quick repair, first check whether the power cord is firmly connected, if normal, and then check the fuse, blown fuse replacement; if the problem persists, you need to contact a professional overhaul or replacement of the power module.

Temperature control abnormality: the temperature is too high or too low during the test, unable to reach the set value. The cause may be temperature control sensor failure, heating or cooling components are damaged. Calibrate the temperature control sensor first, if it is still not normal, you need to check the heating or cooling components, and replace the damaged parts in time.

Poor contact of test fixture: The contact between the chip and the test fixture is not stable, resulting in abnormal test data. Can first clean the fixture surface oxides and dirt, check the elasticity of the fixture spring, the elasticity is not enough to replace; if the chip pin deformation, be careful to repair or replace the chip.

Software Failure

Test Program Error: An error message appears when running the test program, which may be caused by corrupted program files, incompatible versions or wrong parameter settings. After confirming the parameter settings are correct, if the error still occurs, reinstall or update the test program to the latest compatible version.

Abnormal data transmission: Test data cannot be transmitted normally or is lost. Check whether the data transmission cable is connected normally and whether the driver is installed correctly; if it is network transmission, check the network connection and settings to ensure stable data transmission.

Test Process Failure

Test Process Interruption: The test process is suddenly interrupted, which may be due to external interference, equipment overload or insufficient system resources. Check the testing environment to reduce the source of electromagnetic interference; check the running status of the equipment, close unnecessary background programs and release system resources. If the problem still exists, it is necessary to conduct a comprehensive inspection and maintenance of the equipment.

Abnormal test results: Test results differ greatly from expectations, which may be due to incorrect test methods, untimely updating of test standards or quality problems of the chip itself. Re-check the test methods and standards to ensure consistency; if chip quality problems are suspected, conduct sampling and analysis of the chip.

Familiar with the chip aging tester common faults and quick repair methods, can effectively improve the operational efficiency of the equipment, to ensure that the chip test work is carried out smoothly. If you encounter complex faults, contact the equipment supplier or professional maintenance personnel in time.